Process management for avionics - Electronic components capability in operation - Part 2: Semiconductor microcircuit lifetime

IEC TR 62240-2:2018(E) describes a process and a method for selecting digital semiconductor microcircuits by ensuring that their lifetime is compatible with the requirements of aerospace, defence and high performance (ADHP) applications (generally in connection with functional environments). Methods and guidelines are provided to assess the long term reliability of COTS semiconductor microcircuits in such applications; they mainly apply during the electronic design phase when selecting semiconductor microcircuits and assessing the application reliability. focuses on original equipment manufacturers (OEMs) using commercial off the shelf (COTS) semiconductor microcircuits for high performance, high reliability and long duration applications. This document supports OEMs in the preparation and maintenance of their semiconductor electronic component management plan (ECMP).

General Information

Status
Published
Publication Date
17-Jun-2018
Current Stage
PPUB - Publication issued
Start Date
04-Jul-2018
Completion Date
18-Jun-2018
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IEC TR 62240-2:2018 - Process management for avionics - Electronic components capability in operation - Part 2: Semiconductor microcircuit lifetime
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IEC TR 62240-2
®

Edition 1.0 2018-06
TECHNICAL
REPORT

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inside


Process management for avionics – Electronic components capability in
operation –
Part 2: Semiconductor microcircuit lifetime

IEC TR 62240-2:2018-06(en)

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IEC TR 62240-2

®


Edition 1.0 2018-06




TECHNICAL



REPORT








colour

inside










Process management for avionics – Electronic components capability in

operation –

Part 2: Semiconductor microcircuit lifetime


























INTERNATIONAL

ELECTROTECHNICAL


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ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-5769-2




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– 2 – IEC TR 62240-2:2018 © IEC 2018
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviated terms . 7
3.1 Terms and definitions . 7
3.2 Abbreviated terms . 10
4 Lifetime assessment process and method. 11
4.1 General . 11
4.2 Input data for the method .
...

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