IEC 62586-2:2013

IEC 62586-2
®

Edition 1.0 2013-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Power quality measurement in power supply systems –
Part 2: Functional tests and uncertainty requirements

Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –
Partie 2: Essais fonctionnels et exigences d'incertitude

IEC 62586-2:2013

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IEC 62586-2

®


Edition 1.0 2013-12




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Power quality measurement in power supply systems –

Part 2: Functional tests and uncertainty requirements




Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –

Partie 2: Essais fonctionnels et exigences d'incertitude
















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE

PRICE CODE
INTERNATIONALE

CODE PRIX XE


ICS 17.220.20 ISBN 978-2-8322-1292-9



Warning! Make sure that you obtained this publication from an authorized distributor.

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® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 62586-2 © IEC:2013
CONTENTS
FOREWORD . 7
INTR ODUCTION . 9
1  Scope . 10
2  Normative references . 10
3  Terms, definitions, abbreviations, notations and symbols . 10
3.1  General terms and definitions . 11
3.2  Terms and definitions related to uncertainty . 11
3.3  Notat i ons . 12
3.3.1  Func tions . 12
3.3.2  Symbols and abbreviations . 12
3.3.3  Indic e s . 12
4  Requirements . 12
4.1  Requirements for products complying with class A . 12
4.2  Requirements for products complying with class S . 13
5  Functional type tests common requirements . 14
5.1  General philosophy for testing. 14
5.1.1  Measuring ranges . 14
5.1.2  Single "power system influence quantities" . 16
5.1.3  Mixed "power system influence quantities" measuring range . 17
5.1.4  "External influence quantities" . 18
5.1.5  Test criteria . 18
5.2  Testing procedure . 19
5.2.1  Device under test . 19
5.2.2  Testing conditions . 19
5.2.3  Testing equipment . 19
6  Functional testing procedure for instruments complying with class A according to
IEC 61000-4-30 . 19
6.1  Power frequency . 19
6.1.1  General . 19
6.1.2  Measurement method . 19
6.1.3  Measurement uncertainty and measuring range . 20
6.1.4  Measurement evaluation . 21
6.1.5  Measurement aggregation . 21
6.2  Magnitude of supply voltage. 21
6.2.1  Measurement method . 21
6.2.2  Measurement uncertainty and measuring range . 21
6.2.3  Measurement evaluation . 21
6.2.4  Measurement aggregation . 22
6.3  Flicker . 23
6.4  Supply voltage interruptions, dips and swells . 23
6.4.1  General . 23
6.4.2  Check dips / interruptions in polyphase system . 31
6.4.3  Check swells in polyphase system . 33
6.5  Supply voltage unbalance . 34
6.5.1  General . 34

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62586-2 © IEC:2013 – 3 –
6.5.2  Measurement method, measurement uncertainty and measuring
range . 34
6.5.3  Aggregation . 35
6.6  Voltage harmonics . 35
6.6.1  Measurement method . 35
6.6.2  Measurement uncertainty and measuring range . 36
6.6.3  Measurement evaluation . 37
6.6.4  Measurement aggregation . 37
6.7  Voltage inter-harmonics . 39
6.7.1  Measurement method . 39
6.7.2  Measurement uncertainty and measuring range . 39
6.7.3  Measurement evaluation . 40
6.7.4  Measurement aggregation . 40
6.8  Mains signalling voltages on the supply voltage . 42
6.8.1  Measurement method . 42
6.8.2  Measurement uncertainty and measuring range . 44
6.8.3  Aggregation . 45
6.9  Measurement of underdeviation and overdeviation parameters . 45
6.9.1  Measurement method . 45
6.9.2  Measurement uncertainty and measuring range . 47
6.9.3  Measurement evaluation . 47
6.9.4  Measurement aggregation . 47
6.10  Flagging . 49
6.11  Clock uncertainty testing . 51
6.12  Variations due to external influence quantities . 51
6.12.1  General . 51
6.12.2  Influence of temperature . 52
6.12.3  Influence of power supply voltage . 55
7  Functional testing procedure for instruments complying with class S according to
IEC 61000-4-30 . 56
7.1  Power frequency . 56
7.1.1  General . 56
7.1.2  Measurement method . 56
7.1.3  Measurement uncertainty and measuring range . 57
7.1.4  Measurement evaluation . 58
7.1.5  Measurement aggregation . 58
7.2  Magnitude of the supply voltage . 58
7.2.1  Measurement method . 58
7.2.2  Measurement uncertainty and measuring range . 58
7.2.3  Measurement evaluation . 59
7.2.4  Measurement aggregation . 59
7.3  Flicker . 60
7.4  Supply voltage interruptions, dips and swells . 60
7.4.1  General requirements . 60
7.4.2  Check dips / interruptions in polyphase system . 66
7.4.3  Check swells in polyphase system . 68
7.5  Supply voltage unbalance . 69
7.5.1  General . 69

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– 4 – 62586-2 © IEC:2013
7.5.2  Measurement method, measurement uncertainty and measuring
range . 69
7.5.3  Aggregation . 70
7.6  Voltage harmonics . 70
7.6.1  General . 70
7.6.2  Measurement method . 70
7.6.3  Measurement method, measurement uncertainty and measuring
range . 72
7.6.4  Measurement evaluation . 73
7.6.5  Measurement aggregation . 73
7.7  Voltage inter-harmonics . 74
7.8  Mains Signalling Voltages on the supply voltage . 75
7.8.1  General . 75
7.8.2  Measurement method . 75
7.8.3  Measurement uncertainty and measuring range . 75
7.8.4  Aggregation . 75
7.9  Measurement of underdeviation and overdeviation parameters . 75
7.10  Flagging . 75
7.11  Clock uncertainty testing . 77
7.12  Variations due to external influence quantities . 77
7.12.1  General . 77
7.12.2  Frequency measurement . 78
7.12.3  Influence of temperature . 78
7.12.4  Influence of power supply voltage . 79
8  Calculation of measurement uncertainty and operating uncertainty . 80
Annex A (normative) Intrinsic uncertainty, operating uncertainty, and overall system
uncertainty . . 82
Annex B (normative) Calculation of measurement and operating uncertainty for
voltage magnitude and power frequency . 84
Annex C (informative) Further test on dips (amplitude and phase angles changes) . 87
Annex D (informative) Further tests on dips (polyphase): test procedure . 89
Annex E (normative) Gapless measurements of voltage amplitude and harmonics test . 92
Annex F (informative) Gapless measurements of voltage amplitude and harmonics . 95
Annex G (informative) Testing equipment requirements . 103
Annex H (informative) Example of test report . 104
Annex I (informative) Mixed influence quantities . 105
Bibliography . 107

Figure 1 – Overview of test for dips according to test A4.1.1 . 26
Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1 . 27
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1 . 27
Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1 . 27
Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2 . 28
Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2 . 28
Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2 . 29
Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2 . 29
Figure 9 – Sliding reference voltage test . 30

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62586-2 © IEC:2013 – 5 –
Figure 10 – Sliding reference start up condition . 30
Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions . 31
Figure 12 – Detail 2 of waveform for test of polyphase dips/interruptions . 32
Figure 13 – Detail 3 of waveform for test of polyphase dips/interruptions . 32
Figure 14 – Detail 1 of waveform for test of polyphase swells . 33
Figure 15 – Detail 2 of waveform for test of polyphase swells . 34
Figure 16 – Flagging test for class A . 50
Figure 17 – Clock uncertainty testing . 51
Figure 18 – Detail 1 of waveform for test of dips according to test S4.1.2 . 63
Figure 19 – Detail 2 of waveform for tests of dips according to test S4.1.2 . 63
Figure 20 – Detail 1 of waveform for test of swells according to test S4.1.2 . 64
Figure 21 – Detail 2 of waveform for tests of swells according to test S4.1.2 . 64
Figure 22 – Sliding reference voltage test . 65
Figure 23 – Sliding reference start up condition . 65
Figure 24 – Detail 1 of waveform for test of polyphase dips/interruptions . 66
Figure 25 – Detail 2 of waveform for test of polyphase dips/interruptions . 67
Figure 26 – Detail 3 of waveform for test of polyphase dips/interruptions . 67
Figure 27 – Detail 1 of waveform for test of polyphase swells . 68
Figure 28 – Detail 2 of waveform for test of polyphase swells . 69
Figure 29 – Flagging test for class S . 76
Figure 30 – Clock uncertainty testing . 77
Figure A.1 – Different kinds of uncertainties . 82
Figure C.1 – Phase-to-neutral testing on three-phase systems . 87
Figure C.2 – Phase-to-phase testing on three-phase systems . 87
Figure D.1 – Example for on phase of a typical N cycle injection . 90
Figure D.2 – Dip/interruption accuracy (amplitude and timing) test . 91
Figure D.3 – Swell accuracy (amplitude and timing) test . 91
Figure F.1 – Simulated signal under noisy conditions . 95
Figure F.2 – Waveform for checking gapless RMS voltage measurement . 96
Figure F.3 – 2,3 Hz Frequency fluctuation . 96
Figure F.4 – Spectral leakage effects for a missing sample . 97
Figure F.5 – Illustration of QRMS for missing samples . 98
Figure F.6 – Detection of a single missing sample . 98
–6
Figure F.7 – Q for an ideal signal, sampling error = 300 x 10 . 99
RMS
–6
Figure F.8 – Q for an ideal signal, sampling error = 400 x 10 . 99
RMS
–6
Figure F.9 – Q for an ideal signal, sampling error = 200 x 10 . 100
RMS
Figure F.10 – Q with ideal test signal and perfect sampling frequency
RMS
synchronization . 101
–6 –6
Figure F.11 – Q with 300 x 10 sampling frequency error and 100 x 10
RMS
modulation frequency error . 101
Figure F.12 – Q with a 20/24 cycles sliding window with a output every 10/12
RMS
c yc les . 102
Figure F.13 – Amplitude test for fluc tu ating component . 102

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– 6 – 62586-2 © IEC:2013
Table 1 – Summary of type tests for Class A . 13
Table 2 – Summary of type tests for Class S . 14
Table 3 – Testing points for each measured parameter . 14
Table 4 – List of single "power system influence quantities" . 16
Table 5 – List of mixed "power system influence quantities" . 17
Table 6 – Influence of Temperature . 18
Table 7 – Influence of auxiliary power supply voltage . 18
Table 8 – List of generic test criteria. 18
Table 9 – Uncertainty requirements . 81
Table C.1 – Tests pattern . 88
Table I.1 – Mixed influence quantities test for frequency . 105
Table I.2 – Mixed influence quantities test for magnitude of voltage . 105
Table I.3 – Mixed influence quantities test for dips and swells . 106

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62586-2 © IEC:2013 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –

Part 2: Functional tests and uncertainty requirements


FOREWORD
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